Enhanced Bus Speed & High Bandwidth Switching

DDR1 / DDR2 / DDR3 / DDR3L

Low Cost and High Performance are not two phrases you normally see associated with memory test systems. Typically if a memory tester is priced very aggressively then customers make the assumption that standard features will be sacrificed.

With the "Single DUT" and at speeds up to 1600Mbps, the TCE-1333/1600 is equipped with industry-standard features essential for memory productivity.

Triad Spectrum, Inc. has taken it to a new level with the introduction of their new TCE-1333/1600. Features like "Enhanced Bus Speed Testing" and support for high bandwidth data switching are standard on the new TCE-1333/1600. Open/Shorts plus 10 comprehensive AC test patterns give retailers, resellers, integrators, and manufacturers enough testing power to insure that the products they sell will meet the standards of the PC industry. TCE-1333/1600 is the answer to cost effective, high performance DDR1 / DDR2 / DDR3 / DDR3L testing for all levels. Repair shops, system integrators, resellers, VARS/VADS, production floors, etc. now have a choice that makes sense when it comes to testing high speed memory modules.


How to choose the right tester for your business.


  • DDR3 - 800Mbps, 1066Mbps, 1200Mbps, 1333Mbps, 1600Mbps
    [ 240P LODIMM, 240P DIMM LRDIMM, 204P SODIMM, 204P ECC SODIMM, 244P MiniDIMM ]

  • DDR2 - 400Mbps, 533Mbps, 667Mbps, 800Mbps
    [ 240P LODIMM, 144P/200P SODIMM, 244P MiniDIMM ]

  • DDR1 - 200Mbps, 266Mbps, 333Mbps, 400Mbps
    [ 184P LODIMM, 100P/200P x32 LODIMM ]


DDR3 tests clock speeds up to 800Mhz
DDR3 tests cover PC6400, PC8500, PC10600 and PC12800
DDR2 tests clock speeds up to 400Mhz
DDR2 tests cover PC3200, PC4200, PC5300 and PC6400
DDR1 tests clock speeds up to 200Mhz
DDR1 tests cover PC1600, PC2100, PC2700 & PC3200
Supports DDR3L (Low voltage DDR3)
Enhanced bus cycles at speed testing
Supports high bandwidth data switching
Real time Icc monitoring
SPD program/test/read, byte matching, write protection, slot test and serialization
Open/Shorts plus 10 comprehensive AC patterns
Unbuffered and Registered DIMM's
Optional Form-factor adapters
Networking interface connecting up to 8 units

Control up to 8 TCE-1333/1600 with a single PC.


Expand your reach.

  • Affordable high-performance
  • Improve productivity and portable
  • Graphical user interface software
  • Easy expandability
  • Easy network configuration
  • Optional handler interface

NEW! Expand your reach with the advanced TCE-2133 and heat chamber

TCE-2133 and the HCC-125 heat chamber

Speeds continue to increase in the ever changing memory market. Along with the demand for faster speeds customers also want this speed housed in smaller packages.

With both of these demands memory manufacturers are faced with another issue and that is heat. The faster speeds generate more heat and when you put that into a small space heat becomes a major factor in performance.

To enhance the reliability of the modules, the user may test the modules with the new TCE-2133 and the heat chamber in addition. The heat chamber creates a hot testing environment to simulate an accelerated life testing for the user to analyze the behaviour of the modules after extended use.



DDR3 clock frequencies (Mhz): 400, 533, 600, 667 & 800
DDR3 data rate (Mbps): 800, 1066, 1200, 1333 & 1600
DDR2 clock frequencies (Mhz): 200, 266, 333 & 400
DDR2 data rate (Mbps): 400, 533, 667 & 800
DDR1 clock frequencies (Mhz): 100, 133, 166 & 200
DDR1 data rate (Mbps): 200, 266, 333 & 400
DDR3L Vdd - 1.25V to 1.45V
DDR3 Vdd - 1.35V to 1.65V
DDR2 Vdd - 1.65V to 2.0V
DDR1 Vdd - 2.1V to 2.8V
Data width: 72 bits in parallel
Address depth: 16(Row), 15(Column), 3(BS's)
Programmable timing cycles of: tRCD, tAL, tCL, tWL, tRL, tWR, tRRP, tRP, tRFC
Burst Length: 4 and 8
ODT Selection support
OCD Adjustment: Auto calibration
Icc tests: Burst Refresh
PC requirement: Windows Vista or better
Dimensions (WxDxH): 11.6" (295mm) x 8.5" (215mm) x 5.1" (130mm)
Weight: 13 lb (5.9 kg)

Software Screenshots

  • Quick Test (default by factory)

  • Test Device Configuration


  • SPD Data

  • Security Privilege