Enhanced Bus Speed & High Bandwidth Switching
DDR1 / DDR2 / DDR3 / DDR3L
Low Cost and High Performance are not two phrases you normally see associated with memory test systems. Typically if a memory tester is priced very aggressively then customers make the assumption that standard features will be sacrificed.
With the "Single DUT" and at speeds up to 1600Mbps, the TCE-1333/1600 is equipped with industry-standard features essential for memory productivity.
Triad Spectrum, Inc. has taken it to a new level with the introduction of their new TCE-1333/1600. Features like "Enhanced Bus Speed Testing" and support for high bandwidth data switching are standard on the new TCE-1333/1600. Open/Shorts plus 10 comprehensive AC test patterns give retailers, resellers, integrators, and manufacturers enough testing power to insure that the products they sell will meet the standards of the PC industry. TCE-1333/1600 is the answer to cost effective, high performance DDR1 / DDR2 / DDR3 / DDR3L testing for all levels. Repair shops, system integrators, resellers, VARS/VADS, production floors, etc. now have a choice that makes sense when it comes to testing high speed memory modules.
How to choose the right tester for your business.
LODIMM, SODIMM, LRDIMM & MiniDIMM
- DDR3 - 800Mbps, 1066Mbps, 1200Mbps, 1333Mbps, 1600Mbps
[ 240P LODIMM, 240P DIMM LRDIMM, 204P SODIMM, 204P ECC SODIMM, 244P MiniDIMM ]
- DDR2 - 400Mbps, 533Mbps, 667Mbps, 800Mbps
[ 240P LODIMM, 144P/200P SODIMM, 244P MiniDIMM ]
- DDR1 - 200Mbps, 266Mbps, 333Mbps, 400Mbps
[ 184P LODIMM, 100P/200P x32 LODIMM ]
|DDR3 tests clock speeds up to 800Mhz|
|DDR3 tests cover PC6400, PC8500, PC10600 and PC12800|
|DDR2 tests clock speeds up to 400Mhz|
|DDR2 tests cover PC3200, PC4200, PC5300 and PC6400|
|DDR1 tests clock speeds up to 200Mhz|
|DDR1 tests cover PC1600, PC2100, PC2700 & PC3200|
|Supports DDR3L (Low voltage DDR3)|
|Enhanced bus cycles at speed testing|
|Supports high bandwidth data switching|
|Real time Icc monitoring|
|SPD program/test/read, byte matching, write protection, slot test and serialization|
|Open/Shorts plus 10 comprehensive AC patterns|
|Unbuffered and Registered DIMM's|
|Optional Form-factor adapters|
|Networking interface connecting up to 8 units|
Control up to 8 TCE-1333/1600 with a single PC.
Expand your reach.
- Affordable high-performance
- Improve productivity and portable
- Graphical user interface software
- Easy expandability
- Easy network configuration
- Optional handler interface
NEW! Expand your reach with the advanced TCE-2133 and heat chamber
TCE-2133 and the HCC-125 heat chamber
Speeds continue to increase in the ever changing memory market. Along with the demand for faster speeds customers also want this speed housed in smaller packages.
With both of these demands memory manufacturers are faced with another issue and that is heat. The faster speeds generate more heat and when you put that into a small space heat becomes a major factor in performance.
To enhance the reliability of the modules, the user may test the modules with the new TCE-2133 and the heat chamber in addition. The heat chamber creates a hot testing environment to simulate an accelerated life testing for the user to analyze the behaviour of the modules after extended use.
|DDR3 clock frequencies (Mhz): 400, 533, 600, 667 & 800|
|DDR3 data rate (Mbps): 800, 1066, 1200, 1333 & 1600|
|DDR2 clock frequencies (Mhz): 200, 266, 333 & 400|
|DDR2 data rate (Mbps): 400, 533, 667 & 800|
|DDR1 clock frequencies (Mhz): 100, 133, 166 & 200|
|DDR1 data rate (Mbps): 200, 266, 333 & 400|
|DDR3L Vdd - 1.25V to 1.45V|
|DDR3 Vdd - 1.35V to 1.65V|
|DDR2 Vdd - 1.65V to 2.0V|
|DDR1 Vdd - 2.1V to 2.8V|
|Data width: 72 bits in parallel|
|Address depth: 16(Row), 15(Column), 3(BS's)|
|Programmable timing cycles of: tRCD, tAL, tCL, tWL, tRL, tWR, tRRP, tRP, tRFC|
|Burst Length: 4 and 8|
|ODT Selection support|
|OCD Adjustment: Auto calibration|
|Icc tests: Burst Refresh|
|PC requirement: Windows Vista or better|
|Dimensions (WxDxH): 11.6" (295mm) x 8.5" (215mm) x 5.1" (130mm)|
|Weight: 13 lb (5.9 kg)|
- Quick Test (default by factory)
- Test Device Configuration
- SPD Data
- Security Privilege