TurboCATS II-100NF is a high speed single-site tester designed for high volume production environments. With a built in device library you are able to test NAND flash products from almost any manufacturer. You can test individual chips up to 128 Gbytes in size with ratings up to 100Mhz.

The timing editor allows users to define their own timing parameters. The user can either loosen or tighten testing conditions. Pattern Editor allows users to define their own testing patterns to implement address cycle, command cycle, data input/output cycle.

The highly accurate test results are achieved by providing complex AC/DC parametric test patterns. Executing all of the test algorithms is made possible by a super-fast, high bandwidth bus with minimum test time.

Communication between the tester and a PC is accomplished via a LAN port. The user can utilize almost any PC they might have in-house that has WinXP for the O/S. Proprietary software programs provide a friendly GUI interface and an easy to read error display (text and graphical). This allows the user to store test results in the special database and then create report files when needed.

A handler interface allows the tester to communicate to a handler which perform ICs sorting and binning after testing.

An optional hot temperature chamber is available that allows the tester to detect marginal timing issues as well as cell storage sensitivity failures in a high temperature environment. The temperature setting is user programmable from 32°C to 85°C with 1°C resolution.