TCII-1333ST DDR1/DDR2/DDR3
TCIII-1333ST DDR2/DDR3
TCII-1600ST DDR1/DDR2/DDR3
TCIII-1600ST DDR2/DDR3
TCII-1200IC DRAM, SDRAM, DDR1/2/3, Nand/Nor Flash & MCP
     
TCIII-1200IC DRAM, SDRAM, DDR1/2/3, Nand/Nor Flash & MCP
     
TCII-1200D DDR1/DDR2/DDR3
TCIII-1200D DDR1/DDR2/DDR3
TC-Express DDR1/DDR2/DDR3
MBHR-125 Heat Chamber & VBump
Accessories & Extras
HT- 1000 DIMM Handler
HT- 5064 IC Handler



 

Empower your business with advanced technology.

The TCII-1200IC NandFlash and NorFlash tester can be used as a production tool as well as an engineering tool. With the standard industry test patterns available such as Checkerboard and Marching, for use in your testing process, there is no problem selecting the right patterns for your particular needs. In addition to the DC testing, the TCII-1200IC also supports AC testing. The AC testing feature will allow the end user to program test patterns using the script coding method.

 

In a production environment throughput is the key.

The TCII-1200IC comes with 64 sites to assist you in this process. 64 IC can be tested in parallel in order to provide a faster production. Error logging on Block/Page/Column and DQ's is also available.

 

An optional handler interface allows the tester to communicate to a handler which perform ICs sorting and binning after testing.

 

An optional hot temperature chamber is available that allows the tester to detect marginal timing issues as well as cell storage sensitivity failures in a high temperature environment. The temperature setting is user programmable from 32°C to 85°C with 1°C resolution.

 



Traditional test systems provide the user with a variety of AC test patterns to use in their testing process. If a customer wanted the capability to generate a proprietary test pattern, they had to purchase a high-end automated test system. For most companies this is cost prohibitive and not a viable option.

 

Triad Spectrum, Inc. has once again listened to what the customers are saying and is proud to offer a new feature called "Script Code" in its new DDR3/2 test system, the TCII-1200IC. In this new system, the customer can use the script programming language to create a customized test pattern. Once the pattern is created, the "Script Code" pattern generator/ compiler is used to compile the code and then generate the new test pattern.

 


 

The "Script Code" function also serves as a powerful compiler/debug tool. It contains a built-in compiler and debugger for the "Script Code" programming which allows the customer to monitor the timing waveform of the programming algorithm as well as the timing bus transactions. This is all accomplished under the "Signal Tap" tool.

 

The new pattern is then imported into the test list and gives the customer a customized pattern with AC (tSU, tWD, tSAC, tRCD, tCL, tAL, tWR, tRP, tRC, tREF, tRFC, etc.) and DC (Vdd, Vref) parameters for testing their product. In addition to the above, the customer can also create a motherboard test pattern algorithm using the "Script Code" function.

 

The new TCII-1200IC performs the test pattern much faster than using a traditional motherboard test because there are no wait states in the operating system. Utilizing the "Script Code" function gives the customer a high degree of flexibility in terms of timing bus programming for creating unique Read and Write programmingtransactions under best and worse case AC parameters. This can also be used to create a no-wait state bus transaction in the Read to Write cycle.

 

1. Script Code Function

Older model Triad Spectrum test systems provided a wide variety of AC test patterns but did not allow the user to generate a proprietary test pattern. The new TCII-1200IC offers the "Script Code" feature. This will let the end user program proprietary test pattern.

 

Utilizing the script programming language, the customer can create a customized test pattern and then use the Script Code pattern generation compiler to complile and generate the new test pattern. The new pattern is then imported into the test list with AC (tADL, tALH, tALS, tCH, tCS, tAR, tRC, tR, tBERS, tPROG, etc.) and DC (Vforce, Vcc) parameters for customized testing.

 
2. Enhanced Timing Bus

Script Code programming gives the end user a great deal of flexibility in programming the timing bus to create a unique Read and Write bus transaction under best and worst case AC parameters. In addition, a "no wait" state bus transaction can be created in the Read to Write cycle.

 
3. Powerful Debug/Compiler Tool

A built in compiler and debugger environment is in the Script Code programming. This allows the user to monitor the timing waveform of the programming algorithm and the timing bus transactions under the Signal Tag tool.

 

1.  Functional Failure:  Cell stuck-at, coupling, neighborhood sensitivity and software error faults.
2.  Parametric Failure:  (AC) Speed timing vs. Vdd threshold, (DC) Leakage and Icc's.
3.  In-System Failure:  System chipset functional, timing sensitivities and specific application.
4.  Hot-Temperature Failure:  System high temperature environment.

ICs can be tested under a temperature condition with a heat chamber option.
  Seven-segment Temperature Display
  Temperature Setting Option
  Temperature Range (85°C - Room Temperature)
  Pneumatic Control System
  Automatic level-control, manual operation not required
TRIAD SPECTRUM RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND SPECIFICATIONS WITHOUT NOTICE.
Products and specifications discussed herein are for reference purposes only. All information discussed herein is provided on an "AS IS" basis, without warranties of any kind.
  Copyright © 2012 Triad Spectrum, Incorporated.
  All rights reserved.