• Address Mode Depth : Up to 128 Gbytes (24 bits row, 12 bits column)

• Data Width : 8 bits or 16 bits device

• Maximum Frequency : Up to 100Mhz

• Multi-site Testing : 64 of NAND's for 8 bits & 64 of NAND's for 16 bits

• Device Type : Small/Large page, Monolethic/Stack, SLC/MLC

• Package Type : TSOP, USOP, WSOP, etc.

• Voltage Supply : 3.3V, 2.7V & 1.8V

• PC Interface : Graphical User Interface, Database, SAT, Timing Editor, Pattern Editor,
Handler Interface

• S.A.T. : Specific Application Test which allows user to simulate real application environment

• Timing Editor : User defines timing cycles for specific application bus & timing operation

• Pattern Editor : User defines test algorithms for specific test patterns

• ICC Testing : Per site measurement of Standby, Erase, Program & Read Operations

• Leakage Testing : Per site & per pin measurement

• Build in device library : Supports all standard devices

• Sorting & binning : READ ID sorting, errors sorting, density sorting

Main Graphical User Interface

Test File

Graph Timing

Pattern Editor