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• Address Mode Depth: Up to 128 Gbytes (24 bits row, 12 bits column)
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• Data Width: 8 bits or 16 bits device
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• Maximum Frequency: Up to 100Mhz
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• Multi-site Testing: 64 of NAND's for 8 bits & 64 of NAND's for 16 bits
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• Device Type: Small/Large page, Monolethic/Stack, SLC/MLC
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• Package Type: TSOP, USOP, WSOP, etc.
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• Voltage Supply: 3.3V, 2.7V and 1.8V
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• PC Interface: graphical user interface, database, timing editor, pattern editor, handler interface
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• S.A.T.: Specific Application Test which allows user to simulate real application environment
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• Timing Editor: User defines timing cycles for specific application bus and timing operation
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• Pattern Editor: User defines test algorithms for specific test patterns
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• ICC Testing: Per site measurement of Standby, Erase, Program and Read Operation
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• Leakage Testing: Per site and per pin measurement
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• Build in device library: Supports all standard devices
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Copyright © 2010 Triad Spectrum, Incorporated.