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Overview Features Specifications Download

 Address Mode Depth : Up to 128 Gbytes (24 bits row, 12 bits column)

 Data Width : 8 bits or 16 bits device

 Maximum Frequency : Up to 100Mhz

 Multi-site Testing : 64 of NAND's for 8 bits & 64 of NAND's for 16 bits

 Device Type : Small/Large page, Monolethic/Stack, SLC/MLC

 Package Type : TSOP, USOP, WSOP, etc.

 Voltage Supply : 3.3V, 2.7V & 1.8V

 PC Interface : Graphical User Interface, Database, SAT, Timing Editor, Pattern Editor,
Handler Interface

 S.A.T. : Specific Application Test which allows user to simulate real application environment

 Timing Editor : User defines timing cycles for specific application bus & timing operation

 Pattern Editor : User defines test algorithms for specific test patterns

 ICC Testing : Per site measurement of Standby, Erase, Program & Read Operations

 Leakage Testing : Per site & per pin measurement

 Build in device library : Supports all standard devices

 Sorting & binning : READ ID sorting, errors sorting, density sorting


Main Graphical User Interface


Test File


Graph Timing


Pattern Editor

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  All rights reserved.