Combines at speed AC/DC parametric testing with the in-system
Specific Application Test (S.A.T).


ROI continues to be a hot buzz word when memory manufacturers look at capital equipment purchases. Executive management teams question production managers as to when they will see a “Return On Investment”. Triad Spectrum, Inc. understands the dilemma facing companies who must increase production output, while maintaining high quality standards, at a reasonable cost. With the introduction of the TCIII-1200D memory test system, Triad Spectrum has taken the risk out of purchasing high performance ATE’s.

IC testing, or module testing, in a multi-site test system is now available at a very reasonable cost. With options like Script Code Programming, Schmoo Plotting, and Motherboard compatibility testing available, the TCIII-1200D takes all the guess work out of testing efficiency.

Production managers look at a system that can be fully integrated to an automated handling system and when combined with the AC testing features offered as a standard item, the TCIII-1200D system is the preferred choice among memory manufacturers throughout the world. High performance, cost effective, and reliable are terms used to describe the new DDR3 multi-site system.

The system offers over 35 AC patterns as well as DC testing support. Script Code Programming allows the production/design engineer to develop and tweak custom patterns that are customer specific. The system currently supports DDR3 testing at speeds up to 1333Mhz and will be upgradeable to 1666Mbps when the technology is needed.


If higher thru-put is mandatory then the
NEW TCIII-1200-DDR3 system is the solution!!

High-end ATE’s are designed to detect functional and AC/DC parametric failures but they have no easy way of detecting potential in-system failures due to functional and timing compatibility issues generated by the system chipset. To test for motherboard compatibility issues, manufacturers are forced to use a costly and time consuming 2-step process.

Triad Spectrum, Inc. is proud to announce the release of a revolutionary new “single step” test solution to the memory market. The TCIII-1200D test system combines at speed AC/DC parametric testing with the in-system Specific Application Test. The S.A.T. function allows the user to select a plug in motherboard as well as a user selected test program to be used in determining module/motherboard compatibility. Once the functional testing is completed, the system automatically switches over to do the motherboard testing that the customer has selected.

The TCIII-1200D takes the time consuming and costly 2-step process of functional memory testing and motherboard compatibility testing and combines them into a single process. So, the TCIII-1200D supports the thru put increases while costs decrease.

An optional hot temperature chamber is available on the TCIII-1200D to detect marginal timing and cell storage sensitivity failures in a high temperature environment. The chamber may be programmed from 32° C to 85°C with 2°Cresolution.

1. Functional Failure: Cell stuck-at, coupling, neighborhood sensitivity and software error faults.

2. User Script coding lets the user to program proprietary patterns.

3. Parametric Failure: (AC) Speed timing vs. Vdd threshold, (DC) Leakage and Icc's.

4. Hot Temperature Failure: System high temperature environment.