TurboCATS III - 1200IC DRAM/SDRAM/DDR1/DDR2/DDR3/NandFlash/NorFlash/MCP



DDR1	DDR2	DDR3	pSRAM	SDRAM	NandFlash	NorFlash

					Supports both large block and small block architecture
		-			Supports Block/Page/ Column modes	Supports both top boot and bottom boot architecture
					Supports cache read, sequential read and copy back	Supports Block/Column modes
					Flexible bad block management available for read bad block

		-			-	Support 12V fast production programming

					Over 35 industry standard AC test patterns available
Over 35 industry standard AC test patterns available					Over 20 AC timing parameters for AC parametric testing (Async)	Over 15 industry standard AC test patterns available
					Over 15 AC timing parameters for AC parametric testing (Sync)	Over 15 AC timing parameters for AC parametric testing

Results Display (both text and graphical)

Auto Calibration Feature			-	Auto Calibration Feature	-	-

Supports following form factors: Single IC and MCP device

Specific Application Test (S.A.T.) function (optional)			-

Hot chamber and Handler interface (optional)

Parallel Test: 64 DUT Sites in x8, 32 DUT Sites in x16,16 DUT Sites in x32

Minimal control PC: Windows XP+ and networking interface

Test unit dimensions (WxDxH): 40" (1000mm) x 24" (600mm) x 14" (360mm)

AC Power Supply: 110-240 VAC, 50/60 Hz