The TCIII-800ST is a high speed, high performance tester that combines functional and AC/DC parametric testing with in-system motherboard compatibility testing. The SAT or "Specific Application Test" allows the user to select a plug in motherboard and then select a test program to accomplish the one step testing procedure desired by all manufacturers

Traditional functional and parametric testing is accomplished by providing the user with over twenty (20) user selectable industry standard test patters as well as the leakage and Icc tests. Schmoo plotting and address/data error logging provide additional tools to the user and are used for device characterization and failure analysis.

An optional hot temperature chamber is available on the TCIII-800ST to detect marginal timing and cell storage sensitivity failures in a high temperature system environment from 32°C to 85°C with 1°C resolution.

An optional handler interface allows the tester to communicate to a handler which perform ICs sorting and binning after testing.