TCII-1200D DDR1/DDR2/DDR3
TCIII-1200D DDR1/DDR2/DDR3
TCII-1200IC DRAM, SDRAM, DDR1/2/3, Nand/Nor Flash & MCP
     
TCIII-1200IC DRAM, SDRAM, DDR1/2/3, Nand/Nor Flash & MCP
     
TCII- 1200AD DDR1/DDR2/DDR3
TCIII-1200L DDR2/DDR3
TCIII-6400-SNDT SND & DwSND
TC-Express DDR2/DDR3
Accessories & Extras
HT-1000 DIMM Handler
HT-5064 IC Handler
Flash Menu Placeholder.
 
New!  1.33Gbps - DDR1 / DDR2 / DDR3
4 powerful DC functions for today's OEM
Model:  TCII-1200AD

  "Optional" 4, 8, 12 or 16 module testing, in parallel,
for high thru-put on production
  Form factor supports: 240P LODIMM, 200P SODIMM,
204P SODIMM, IC components & Custom form factors


 
New!  1.33Gbps - DDR2 / DDR3
Supports 8 and 16 DUT's in parallel testing.
Model:  TCIII-1200L

  "Optional" 8 or 16 test sockets available for faster
thru-put in a production environment
  Single test adapter supports both unbuffered and
registered module testing


1.33Gbps - DRM, SDRM, DDR1/2/3, Nand/Nor Flash & MCP
64 ICs can be tested in parallel.
Model:  TCIII-1200IC

  IC components and custom test socket load boards
  Supports Block/Page/Column modes
  Over 35 industry standard AC test patterns available
  "Optional" heat chamber and handler interface


1.33Gbps - DRM, SDRM, DDR1/2/3, Nand/Nor Flash & MCP
64 DUT sites can be test in parallel.
Model:  TCII-1200IC

  Supports both large block and small block architecture
  Supports AC/DC parametric tests
  "Optional" User Script Code for customized test patterns
  "Optional" heat chamber and handler interface


 
New!  IBM Super NOVA FBDIMM (SND/DwSND)
DDR3 Fully Buffer DIMM (DD1.0 & x81)
Model:  TCIII-6400-SNDT

  8 sites in parallel
  4GB, 8GB, 16GB and 32GB memory capacity
  Open/short and AC pattern tests
  VPD read, write, verify and test


 
New!  1066Mbps & 1333Mbps
LODIMM / SODIMM / UDIMM / RDIMM
Model:  TCEX-1333

  DDR3 tests clock speeds up to 667Mhz
  DDR2 tests clock speeds up to 400Mhz
  Enhanced bus cycles at speed testing
  Open/Shorts plus 7 comprehensive AC patterns


 
1.33Gbps - DDR1 / DDR2 / DDR3
Testing 8 or 16 modules in parallel.
Model:  TCIII-1200D

  Configurable for testing 8 or 16 modules in parallel & at speed
  Supports AC/DC parametric
  "Optional" user selected motherboard for S.A.T function
  "Optional" user defined script code test pattern programming


 
1.33Gbps - DDR2 / DDR3
Dual sockets to 4 or 8 sockets in parallel.
Model:  TCII-1200D

  "Optional" 2, 4 or 8 module testing, in parallel and at speed
  Over 35 industry standard AC test patterns available
  Single adapter supports both unbuffered and registered
 module testing


 
HT-1000 DIMM Handler
High parallel test of up to 4 DUT's tester.
Model:  HT1000

  Advanced capabilities that support high throughput
parallel testing
  Flexible DUT interface assembly
  High parallel test of up to 4 DUTs per tester, 1 tester


 
HT-5064 IC Handler
Allows parallel testing of 64 DUT's per tester.
Model:  HT-5064

  High capacity state-of-the-art handling test system
  High parallel test of up to 64 DUTs per tester
  Suitable for mass production use
  Advanced programming capabilities


 
800Mhz - DDR1 / DDR2
Motherboard connection for Specific Application Test.
Model:  TCIII-800ST

  Multi-site memory module testing (MST)
  DDR2 - Up to (800Mhz) PC6400 Data Bandwidth
  Form Factors supported - 240P LODIMM, 200P SODIMM,
276P IBM Server DIMM and customized test adapters


 
NAND Flash tester
Package Type : TSOP, USOP, WSOP, etc.
Model:  TCIII-100NF

  Address Mode Depth: Up to 128 Gbytes
(24 bits row, 12 bits column)
  Data Width: 8 bits or 16 bits device
  Maximum Frequency: Up to 100Mhz


 
800Mhz - DDR1 / DDR2
Allows for DDR2 testing at speeds up to 800Mhz.
Model:  TCII-ACPF-800

  DDR2 - PC3200, PC3500, PC4300, PC4500, PC5300 & PC5600
  DDR1 - PC1600, PC1700, PC2100, PC2200, PC2700, PC2800
  Over 35 complex AC/DC parametric test patterns
  Supports leakage and Icc tests


 
NAND Flash tester
An optional hot temperature chamber is available.
Model:  TCII-100NF

  Address Mode Depth: Up to 128 Gbytes
(24 bits row, 12 bits column)
  Data Width: 8 bits or 16 bits device
  8 of NAND's for 8 bits and 4 of NAND's for 16 bits


 
800Mhz - DDR1 / DDR2
Over-clocking guard-band support.
Model:  TCI-ACPF-800

  DDR2 speed test up to 800Mhz
  DDR1 speed test up to 440Mhz
  Supports at speed test AC test pattern
  Supports leakage, Icc tests and Auto-ID function


 
TurboCATS Accessories & Extras

Offers a wide selection of accessories such as DDR3 SODIMM 204 pin test adapter , 240 pin Long DIMM test socket, heat chamber, BGA test socket, converter, power supply, test switch and more.
 


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