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NEW! 1.33Gbps / 1.60Gbps - DDR2 / DDR3
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Model: TCII-1600ST
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• Now available for upgrade to 1.6Gbps DDR3
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• "Optional" 4, 8, 12 or 16 module testing, in parallel,
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for high thru-put on production |
• 4 powerful DC functions for today's OEM
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• Form factor supports: 240P LODIMM, 204P/200P SODIMM,
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184P LODIMM, IC components and Custom form factors
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NEW! 1.33Gbps / 1.60Gbps - DDR2 / DDR3
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Model: TCIII-1600ST
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• Now available for upgrade to 1.6Gbps DDR3
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• "Optional" 8 or 16 test sockets available for faster
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thru-put in a production environment |
• DDR2 and DDR3 memory testing options available
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• Over 35 industry standard AC test patterns available
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• "Optional" User script pattern programming
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1.33Gbps - DRAM / SDRAM / DDR1 / DDR2 / DDR3
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Nand Flash / Nor Flash / MCP
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Model: TCIII-1200IC
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• 64 ICs can be tested in parallel
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• IC components and custom test socket load boards
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• Over 35 industry standard AC test patterns available
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• "Optional" heat chamber and handler interface
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1.33Gbps - DRAM / SDRAM / DDR1 / DDR2 / DDR3
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Nand Flash / Nor Flash / MCP
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Model: TCII-1200IC
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• 64 DUT sites can be tested in parallel
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• Supports both large block and small block architecture
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• Supports AC/DC parametric tests
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• "Optional" User Script Code for customized test patterns
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• "Optional" heat chamber and handler interface
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NEW! 1.066Gbps / 1.333Gbps / 1.60Gbps
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Model: TC-Express
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• DDR1 / DDR2 / DDR3 / DDR3L
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• LODIMM / SODIMM / UDIMM / RDIMM
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| • Enhanced bus speed & high bandwidth switching |
• Real time ICC monitoring & SPD functions
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| • Open/Shorts plus 10 comprehensive AC patterns |
| • Heat chamber optional |
 
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NEW! Heat Chamber & Motherboard VBump
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Model: MBHR-125
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• DDR3 - Vdd can vary from 1.35v to 1.6v
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• DDR2 - Vdd can vary from 1.65v to 2.0v
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| • Includes both a heat chamber & a Vdd swing simulator |
• Real time temperature monitoring
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| • No software required |
 
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1.33Gbps - DDR2 / DDR3
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Model: TCIII-1333ST
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• Considering upgrading to 1.6Gbps DDR3 now
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• "Optional" 8 or 16 module testing, in parallel
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• Supports SPD programming, read, test & write-protected
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• Single test adapter supports both unbuffered and
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register module testing |
 
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1.33Gbps - DDR2 / DDR3
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Model: TCII-1333ST
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• Considering upgrading to 1.6Gbps DDR3 now
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• "Optional" 4, 8, 12 or 16 module testing, in parallel
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• Supports AC/DC parametric and user script pattern programming
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• "Optional" handler interface and automatic handler
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HT-1000 DIMM Handler
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Model: HT1000
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• High parallel test of up to 4 DUT's tester
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• Advanced capabilities that support high throughput
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parallel testing |
• Flexible DUT interface assembly
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• High parallel test of up to 4 DUTs per tester, 1 tester
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HT-5064 IC Handler
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Model: HT-5064
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• Allows parallel testing of 64 DUT's per tester
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• High capacity state-of-the-art handling test system
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• High parallel test of up to 64 DUTs per tester
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• Suitable for mass production use
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• Advanced programming capabilities
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800Mhz - DDR2
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Model: TCIII-800ST
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• Motherboard connection for Specific Application Test
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• Multi-site memory module testing (MST)
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• DDR2 - Up to (800Mhz) PC6400 Data Bandwidth
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• Form Factors supported - 240P LODIMM, 200P SODIMM,
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276P IBM Server DIMM and customized test adapters |
 
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NAND Flash tester
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Model: TCIII-100NF
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• Package Type : TSOP, USOP, WSOP, etc.
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• Address Mode Depth: Up to 128 Gbytes
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(24 bits row, 12 bits column) |
• Data Width: 8 bits or 16 bits device
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• Maximum Frequency: Up to 100Mhz
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NAND Flash tester
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Model: TCII-100NF
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• Hot temperature chamber is available
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• Address Mode Depth: Up to 128 Gbytes
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(24 bits row, 12 bits column) |
• Data Width: 8 bits or 16 bits device
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• 8 of NAND's for 8 bits and 4 of NAND's for 16 bits
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TurboCATS Accessories & Extras
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Offers a wide selection of accessories such as DDR3 SODIMM 204 pin test adapter, 240 pin Long DIMM test socket, heat chamber, BGA test socket, converter, power supply, test switch and more.
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