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New! 1.33Gbps - DDR1 / DDR2 / DDR3
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4 powerful DC functions for today's OEM
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Model: TCII-1200AD
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• "Optional" 4, 8, 12 or 16 module testing, in parallel,
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| for high thru-put on production |
• Form factor supports: 240P LODIMM, 200P SODIMM,
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204P SODIMM, IC components & Custom form factors
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New! 1.33Gbps - DDR2 / DDR3
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Supports 8 and 16 DUT's in parallel testing.
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Model: TCIII-1200L
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• "Optional" 8 or 16 test sockets available for faster
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| thru-put in a production environment |
• Single test adapter supports both unbuffered and
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| registered module testing |
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1.33Gbps - DRM, SDRM, DDR1/2/3, Nand/Nor Flash & MCP
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64 ICs can be tested in parallel.
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Model: TCIII-1200IC
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• IC components and custom test socket load boards
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• Supports Block/Page/Column modes
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• Over 35 industry standard AC test patterns available
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• "Optional" heat chamber and handler interface
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1.33Gbps - DRM, SDRM, DDR1/2/3, Nand/Nor Flash & MCP
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64 DUT sites can be test in parallel.
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Model: TCII-1200IC
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| • Supports both large block and small block architecture |
• Supports AC/DC parametric tests
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• "Optional" User Script Code for customized test patterns
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• "Optional" heat chamber and handler interface
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New! IBM Super NOVA FBDIMM (SND/DwSND)
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DDR3 Fully Buffer DIMM (DD1.0 & x81)
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Model: TCIII-6400-SNDT
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• 8 sites in parallel
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• 4GB, 8GB, 16GB and 32GB memory capacity
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• Open/short and AC pattern tests
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• VPD read, write, verify and test
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New! 1066Mbps & 1333Mbps
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LODIMM / SODIMM / UDIMM / RDIMM
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Model: TCEX-1333
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• DDR3 tests clock speeds up to 667Mhz
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• DDR2 tests clock speeds up to 400Mhz
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• Enhanced bus cycles at speed testing
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• Open/Shorts plus 7 comprehensive AC patterns
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1.33Gbps - DDR1 / DDR2 / DDR3
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Testing 8 or 16 modules in parallel.
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Model: TCIII-1200D
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• Configurable for testing 8 or 16 modules in parallel & at speed
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• Supports AC/DC parametric
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• "Optional" user selected motherboard for S.A.T function
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• "Optional" user defined script code test pattern programming
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1.33Gbps - DDR2 / DDR3
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Dual sockets to 4 or 8 sockets in parallel.
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Model: TCII-1200D
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| • "Optional" 2, 4 or 8 module testing, in parallel and at speed |
• Over 35 industry standard AC test patterns available
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• Single adapter supports both unbuffered and registered
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module testing
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HT-1000 DIMM Handler
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High parallel test of up to 4 DUT's tester.
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Model: HT1000
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| • Advanced capabilities that support high throughput |
| parallel testing |
• Flexible DUT interface assembly
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• High parallel test of up to 4 DUTs per tester, 1 tester
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HT-5064 IC Handler
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Allows parallel testing of 64 DUT's per tester.
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Model: HT-5064
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| • High capacity state-of-the-art handling test system |
• High parallel test of up to 64 DUTs per tester
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| • Suitable for mass production use |
• Advanced programming capabilities
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800Mhz - DDR1 / DDR2
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Motherboard connection for Specific Application Test.
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Model: TCIII-800ST
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| • Multi-site memory module testing (MST) |
| • DDR2 - Up to (800Mhz) PC6400 Data Bandwidth |
• Form Factors supported - 240P LODIMM, 200P SODIMM,
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| 276P IBM Server DIMM and customized test adapters |
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NAND Flash tester
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Package Type : TSOP, USOP, WSOP, etc.
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Model: TCIII-100NF
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| • Address Mode Depth: Up to 128 Gbytes |
| (24 bits row, 12 bits column) |
• Data Width: 8 bits or 16 bits device
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• Maximum Frequency: Up to 100Mhz
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800Mhz - DDR1 / DDR2
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Allows for DDR2 testing at speeds up to 800Mhz.
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Model: TCII-ACPF-800
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| • DDR2 - PC3200, PC3500, PC4300, PC4500, PC5300 & PC5600 |
• DDR1 - PC1600, PC1700, PC2100, PC2200, PC2700, PC2800
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• Over 35 complex AC/DC parametric test patterns
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• Supports leakage and Icc tests
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NAND Flash tester
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An optional hot temperature chamber is available.
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Model: TCII-100NF
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| • Address Mode Depth: Up to 128 Gbytes |
| (24 bits row, 12 bits column) |
• Data Width: 8 bits or 16 bits device
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• 8 of NAND's for 8 bits and 4 of NAND's for 16 bits
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800Mhz - DDR1 / DDR2
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Over-clocking guard-band support.
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Model: TCI-ACPF-800
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| • DDR2 speed test up to 800Mhz |
| • DDR1 speed test up to 440Mhz |
• Supports at speed test AC test pattern
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• Supports leakage, Icc tests and Auto-ID function
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TurboCATS Accessories & Extras
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Offers a wide selection of accessories such as DDR3 SODIMM 204 pin test adapter , 240 pin Long DIMM test socket, heat chamber, BGA test socket, converter, power supply, test switch and more.
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Copyright © 2010 Triad Spectrum, Incorporated.